The DW series analyzers are configured with powerful miniature X-ray tubes, Si-PIN detectors or highly advanced silicon drift detectors (SDDs), specialized filters, and multibeam optimization for the ultimate in XRF field analysis. The actual overall value of the DRAWELL analyzer is embodied in the following: it can make correct decisions in real-time without relying on laboratory tests far away from the detection environment.
Spesifikasi: Weight: Device: 1.50kg, 1.65kg with battery. Dimension: 250mm x 75mm x 270mm (L*W*H) Excitation source: High-power high-performance X-ray microtube Target materials: Five target materials of X-ray tube available:gold (Au), silver (Ag), tungsten (W), tantalum (Ta) and palladium (Pd) Voltage: 35kV-50kV voltage (changeable) Filter: A variety of selectable filters, automatically adjusted according to different tested objects Detector: High-resolution Si-Pin detector Detector refrigeration temperature: Peltier effect semiconductor refrigeration system Standard film: External 316 standard film/window protection cover (Optional built-in standard film, plus version) Power supply: 1 lithium battery (7.2v\6600mAh) Processor: High-performance ARM pulse processor Data processing: 32G large-capacity data storage card: ≥80,000 sets of data and spectrograms; Display screen: High-resolution TFT industrial-grade colored high-definition touch screen, it is ergonomic, sturdy, dust-proof, and waterproof, clearly visible under any light conditions Outline design: The integrated designed body is sturdy, waterproof, dustproof,antifreeze, shockproof, and can be used normally in harsh environments. Safe operation: “One key” detection, auto-lock, detection auto-stop functions. The X-ray will automatically be turned off if there is no sample in front of the detection window for 2 seconds. 3/2 of the shell of the device is covered with a 6061 aluminum alloy frame design, with better X-ray blockage. Detection Report: Customized detection report available as per the customers’ demands Element analysis: Au, Pt, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hf, Ta, W, Pb, Bi, Zr, Nb, Mo, Cd, Sn, Sb, Re, In, Ag,Pd, Ru, Rh, Ir, etc.
The K5800/K5800C nano spectrophotometer is a new full-wavelength ultra-micro spectrophotometer, which can be used to detect nucleic acids, proteins, cell solutions, microarray samples, and conventional full-wavelength scanning. At the same time, there are a dark room and a detection platform, and you can choose two measurement modes: cuvette and detection platform.
An atomic absorption spectrometer(AAS), also known as atomic absorption spectrophotometer, analyzes metal elements according to the effect of ground state atomic vapor on characteristic radiation absorption. It can determine trace or trace elements sensitively and reliably.
The wavelength dispersive X-ray fluorescence spectrometer (WDXRF) is a high-tech product developed by our company based on the experience and fruits of domestic R&D on similar instrument over years, and absorbing the international advanced technology, The technical performance indexes have reached the level of international similar products. It can be used in any field that requires analysis of elements or compounds from Na to U, such as building materials (cement, glass, ceramics), metallurgy (iron and steel, non-ferrous metals), petroleum (trace elements such as S, Pb, etc.), chemical industry, geological mining, commodity inspection, quality inspection and even human trace elements inspection and so on.