Product
Xray Microscopy - ZEISS Xradia CrystalCT
ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
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Xray Microscopy - ZEISS Xradia Context MicroCT
ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.
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Xradia Ultra - ZEISS Xradia 810 or 800 Ultra
In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput that are greatly improved with Xradia 810 Ultra.
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Versa X-ray Microscopes - ZEISS Xradia 515
Experience exceptional versatility in your scientific and industrial research with ZEISS Xradia 515 Versa, a trusted X-ray microscope for modern labs. Its hallmark Resolution at a Distance (RaaD) capability ensures class-leading resolution over longer working distances, fostering groundbreaking insights for a wide variety of sample types. Paired with powerful contrast and 4D/in situ capabilities for a variety of research needs, this flexible platform ensures a fast time to results.
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Versa X-ray Microscopes - ZEISS VersaXRM 615
Unlock new degrees of versatility for your scientific and industrial research with ZEISS VersaXRM 615. This cost-effective solution for a high-end X-ray microscope delivers advanced resolution and contrast, pushing non-destructive imaging further for accelerated research. With innovative source and optics technology, enjoy rapid tomography scans that maintain quality. Seamless workflows facilitate the discovery of high resolution interest areas without sample alteration.
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Versa X-ray Microscopes - ZEISS VersaXRM 730
ZEISS VersaXRM™ 730 offers submicron imaging with 450-500 nm resolution across 30-160 kV with the exclusive 40x-Prime objective. Its ZEN navx™ automated user guidance and control system and AI-driven DeepRecon Pro streamline workflows, optimize image quality, and speed throughput. Designed for accessibility, it supports a broad user spectrum, enabling advanced research capabilities with ease for your whole team.
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Imaging Systems - ZEISS Axioscan 7
Digitize your specimens with Axioscan 7 – the reliable, reproducible way to create high-quality virtual microscope slides. Axioscan 7 combines qualities that you would not expect to get in a slide scanner: high speed digitization and outstanding image quality plus an unrivaled variety of imaging modes are all available in a fully automated and easy to operate system.
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Imaging Systems - ZEISS Celldiscoverer 7
If your research requires explorative high-content imaging, you are often faced with a trade-off between the desired image quality and the need to capture large amounts of data efficiently. ZEISS Celldiscoverer 7 is your research companion for collecting statistically relevant data, giving you easy access to high-quality imaging, adaptability to demanding experiments, and stable long-term operation.
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FIB-SEM - ZEISS Crossbeam 550
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.
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FIB-SEM - ZEISS Crossbeam 350
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.
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Scanning Electron Microscopes - ZEISS Volutome
Image the ultrastructure of biological, resin-embedded samples in 3D over large areas. ZEISS Volutome is an end-to-end solution from hardware to software including image processing, segmentation, and visualization. The ultramicrotome can be easily replaced by a conventional SEM stage, converting your 3D FE-SEM into a standard, multipurpose FE-SEM, making your system adaptable to a multi-purpose environment.
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Scanning Electron Microscopes - ZEISS EVO Family
The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users. With its comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.
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