The ZEISS Sigma family combines field emission scanning electron microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase productivity. Study new materials, particles for quality inspection or biological or geological specimens. Make no compromises in high resolution imaging – go to low voltages and benefit from enhanced resolution and contrast at 1 kV or below. Execute advanced analytical microscopy using best-in-class EDS geometry and get analytical data at twice the speed and with more precision.
Spesifikasi: Type of Diode: Silicon based diode for direct detection of backscattered electrons, one segment Image Polarity: Configurable. Default: “TEM” like contrast Optimum Working Distance: 4 – 6 mm Energy Range: < = 7 keV Optimum Primary Beam Current: 50 pA – 1nA Mechanical Module: Highly stable mechanical module with acoustic dampening cover Easy Servicability: Diode exchange is plug & play Protection: Protective cover to avoid charging and damage to the diode. Integrated protection during plasma cleaning of sample/chamber. Lifetime: Expected lifespan of detector diode: 2 years under average usage conditions System Integration: Collision control with ZEISS hardware implemented. Acceleration voltage limited to <7 kV. EO table correction is applied. User Interface: Default settings optimized for ease of use. Insertion and Retraction: Pneumatic
ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.
In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput that are greatly improved with Xradia 810 Ultra.