Image the ultrastructure of biological, resin-embedded samples in 3D over large areas. ZEISS Volutome is an end-to-end solution from hardware to software including image processing, segmentation, and visualization. The ultramicrotome can be easily replaced by a conventional SEM stage, converting your 3D FE-SEM into a standard, multipurpose FE-SEM, making your system adaptable to a multi-purpose environment.
Spesifikasi: SEM in-chamber ultramicrotome: Dedicated high precision stage which replaces SEM stage, easy to exchange Cutting Microtome mechanical hardware precision in Z: step size 5 nm – 200 nm, in 1 nm increment (user definable) Minimum cut thickness achievable on biological samples: down to 25 nm (sample dependent) Maximum cutting thickness: 200 nm Cutting speed: 0.01 mm/sec – 6.5 mm/sec (user definable) Typical cutting speed: 0.1 mm – 1 mm Oscillation during cutting: available Cutting window: > 5 mm (user definable by software) Diamond knife size: 1.5 mm or 2.5 mm (by DiATOME) Motorized sample Z travel range: 1.2 mm Microtome stage X/Y travel: 2 mm × 2 mm Maximum sample size: 1 mm × 1 mm × 1 mm Typical block size: 600 µm × 600 µm × 600 µm Contrast: En-bloc staining (heavy metals) Acceleration voltage: Up to 7 kV Optimum primary beam current: 50 pA – 1 nA Working distance: ≤ 5 mm System integration: Fully integrated, default settings optimized for ease of use, collision control with ZEISS hardware implemented, Electron optics (EO) correction is applied
ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.
In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput that are greatly improved with Xradia 810 Ultra.