Stemi 508 is compact, reliable and equipped with optics and mechanics designed for heavy workloads. With the large 36 mm object field you always keep the overview of your sample. The 8:1 zoom then allows to bring details up to 50× magnification. You even have larger samples? Add interchangeable optics and observe an area of up to 122 mm, making Stemi 508 a top performer in its class.
Spesifikasi: Type of Microscope: Stereo microscope, Greenough design Design Principle: Two zoom systems, tilted by the stereo angle Stereoscopic View: Threedimensional observation through eyepieces Apochromatic Corrected Zoom and Front Optics: Image free of color fringes in complete magnification range Magnification Range: 6.3× – 50× Free Working Distance: 92 mm Maximum Resolution: Test slide: 225 Lp/mm Resolving power (Rayleigh criterion) g = 4.4 µm Smallest Object Structure g/2 = 2.2 µm Maximum Object Field Diameter: 36.8 mm Accessible Magnification Range: 1.9× – 250× Free Working Distances: 35 – 287 mm Maximum Resolution: Test slide: 450 Lp/mm Resolving power (Rayleigh criterion) g = 2.2 µm Smallest Object Structure g/2 = 1.1 µm Maximum Object Field Diameter: 122.7 mm Manual Zoom, Zoom Range: 8:1 (0.63×...5.0×) Quality of Zoom Optics: Distortion free, excellent contrast, apochromatic corrected Parfocality of Zoom Optics: Object remains focused while zooming Ergonomic Viewing Angle: 35° Adjustment of Interocular Distance: 55 – 75 mm Height / Lifting range: 360 mm / 190 mm Load capacity of Stemi mount: 5 kg
ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.
In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput that are greatly improved with Xradia 810 Ultra.