Designed for years of high quality use, the Eclipse E100-LED is an upright microscope with outstanding optical performance combined with elegant ergonomic touches. The E100-LED, ideal as an educational or student microscope, incorporates Nikon's exclusive CFI infinity optical system and an high-intensity LED eco-illumination system that is IR-free, virtually eliminating eyestrain for users. In addition, advanced Nikon BE Plan Achromat objectives have been designed especially for the E100 with excellent optical corrections and very flat optical performance. This means clear, bright images at every magnification.
Optical system : CFI45 Infinity Optical System Illumination : High luminescent white LED illuminator (Eco-illumination) & 6V20W halogen lamp, Compliant multi-voltage (100 V-240 V) Eyepieces (F.O.V.) : CFI E 10x (18 mm) & CFI E 15x (12 mm) Focusing : Coaxial coarse/fine focusing, Cross roller guide, Focusing stroke: 22 mm, Coarse: 37.7 mm/rotation, Fine: 0.2 mm/rotation, Coarse motion torque adjustable Eyepiece Tube : E2-TB Binocular Tube & E2-TF Trinocular Tube, Eyepiece/Port: 100/0, 0/100, 360º rotatable Nosepiece : Quadruple nosepiece (within main body), Revolving mechanism with multiple ball bearings, Elastic nosepiece grip-ring Stages : Rectangular mechanical stage (within main body), with specimen holder, with vernier calibrations, Cross travel: 76 (X) x 40 (Y) mm Observation methods : Brightfield, Darkfield, Phase contrast Optional accessories : Phase contrast attachment, Object marker, Darkfield ring unit, Mirror unit, Cord hanger, Storage case Power Consumption (max.) : Normal value: 3 W (LED model), 33 W (halogen model) Weight (approx.) : 6 kg (Binocular standard set)
ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.
In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput that are greatly improved with Xradia 810 Ultra.