ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
Spesifikasi: Minimum Achievable Voxel [a]: 0.5 µm Spatial Resolution [b]: 0.95 µm Achievable Voxel at Working Distance [a,c]: 0.5 µm at 0.5 mm; 0.8 µm at 2.5 mm; 2.5 µm at 12.5 mm; 4.0 µm at 25 mm; 12.1 µm at 100 mm Grain Detectability: 20 µm Grain Orientation Angular Resolution: 0.1° Crystal Symmetries: Cubic, Hexagonal, Trigonal, Tetragonal, Orthorhombic, Monoclinic, Triclinic DCT Advanced Acquisition Modes: Three DCT modes, including Helical Phyllotaxis, Helical Phyllotaxis-Raster, and Helical Phyllotaxis-HART DCT X-ray Source Apertures: Set of three self-aligning DCT apertures DCT Detector Beamstops: Set of six zero-order beamstops DCT Reconstruction and Visualization: GrainMapper3D powered by Xnovo Technology Type: Spot Stabilized, Sealed Transmission Tube Voltage Range: 30 – 160 kV Maximum Output: 10 W High Speed, Large Array CMOS Flat Panel: 3072 1944 pixels Single Field of View (diameter / height): 140 mm / 93 mm Maximum Field of View (diameter / height): 140 mm / 165 mm Chassis: Proven stable Xradia Versa platform Vibration Isolation: Granite base Temperature Control: Temperature-stabilized interior Drift Correction Capabilities: Adaptive Motion, Sample Drift, and Thermal tracking and compensation; plus, proprietary advanced methods Artifact-Free Imaging Methods: Dynamic Ring Removal; Secondary Referencing; plus, proprietary advanced methods Sample Stage (load capacity): 25 kg Sample Stage Travel (x, y, z, θ): 50, 100, 50 mm, 360° motorized micro-positioning capability Sample Region-of-Interest (ROI): Intuitive 3D navigation for precise ROI positioning enabled by innovative sample stage architecture Source Travel (z): 190 mm Detector Travel (z): 475 mm
ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.
In XRM, contrast depends on the material being imaged and the X-ray energy used. The Xradia Ultra family comprises of Xradia 800 Ultra, operating at 8 keV photon energy, and Xradia 810 Ultra, operating at 5.4 keV. In general, lower energy X-rays are absorbed more strongly and therefore will provide you with higher contrast for most materials. Thus, as long as transmission remains sufficient, you will experience resulting image quality and/or throughput that are greatly improved with Xradia 810 Ultra.